Reliability investigations on HBV using pulsed electrical stress
نویسندگان
چکیده
First reliability investigations with HBV are presented using pulsed electrical stress. AlGaAs/GaAs material systems as well as InGaAs/InAlAs have been investigated and compared regarding degradation characteristics and mechanisms. Diffusion is proposed to be the responsible degradation mechanism.
منابع مشابه
Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress
The transmission line pulse method (TLP) is used to characterise the reliability of bolometric GaAs microwave power-sensors. Two degradation mechanisms are identified during the degradation process of the absorbing NiCr termination, in which the input power is converted into heat. Simulations and a material analysis have been performed in order to characterise the observed degradation mechanisms.
متن کاملStress Measurement Using Pulsed Eddy Current Thermography
This paper reports a noncontact inspection method, using Pulsed Eddy Current (PEC) stimulated thermography, for the evaluation of the anisotropic dependency of electrical conductivity of steel exposed to tensile stress. This method combines microscope lens based thermography with PEC using a rectangular excitation coil, giving directional excitation, to infer the electromagnetic properties vari...
متن کاملA High Gain Bipolar Pulse Generator with Low Voltage Input Source
This paper proposes a pulsed power generator which consists of two types of switched-capacitor booster modules. A doubling mode module employed to elevate the input voltage to a specified level and, constant mode module is used to increase the elevated voltage into the finally intended bipolar output voltage. Also, the proposed modular structure does not utilize any switches across the load. Ot...
متن کاملCompared deep class-AB and class-B ageing on AlGaN/GaN HEMT in S-Band pulsed-RF operating life
AlGaN/GaN HEMTs are on the way to lead the RF-power amplification field according to their outstanding performances. However, due to its relative youth, reliability studies in several types of operating conditions allow to understand mechanisms peculiar to this technology and responsible for the wearing out of devices. This paper reports the reliability study on two power amplifiers using NITRO...
متن کاملApplication of Pulsed Digital Oscillators (pdo) to the In-situ Mechanical Test of Mems for Space Applications
The objective of this work is to propose Pulsed Digital Oscillators as a possible tool for the in situ monitoring of MEMS in space applications. The reliability of MEMS devices is an important issue for space applications. These devices are prone to mechanical as well as electrical damages. Although extensive knowledge exists on the failure mechanisms of microelectronic devices, there is no sta...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Microelectronics Reliability
دوره 42 شماره
صفحات -
تاریخ انتشار 2002